Available Measurement Systems:

• MPMS XL (Magnetic Properties Measurement System)
  • MPMS XL
  • AC
  • RSO (Reciprocating Sample Option)
  • Sample Space Oven
  • Horizontal Sample Rotator
  • EDC (External Device Control)
  • EDR (Extended Dinamic Range)
  • Resistivity probe
  • Pressure Cell MPMS
  • Fiber Optic Sample Holder (FOSH)
• PPMS 14T (Physical Properties Measurement System)
  • PPMS 14T
  • ACMS (Extraction magnetometer)
  • VSM (Vibrating Sample Magnetometer)
  • Oven VSM
  • TTO (Thermal Transport)
  • ACT (AC resistivity Transport measurements; He-3 compatible)
  • HC (Heat Capacity; He-3 compatible)
  • DC Resistivity (He-3 compatible)
  • He-3 (optional; allows temperature operation down to 0.35 K)
  • XacTransversal (Susceptibility transverse to H))
  • Pressure Cell PPMS (DC Resistivity measurements; He-3 non-compatible) con He-3)
  • Horizontal rotator resistivity
• NanoMOKE3 (Magneto-Optic Kerr Effect)
• Permeameter
• Additional instrumentation
• Options
  • AC
  • Low field
  • Sample Space Oven
  • Horizontal Sample Rotator
  • EDC (External Device Control)
  • EDR (Extended Dinamic Range)
  • Resistivity probe
  • Pressure Cell MPMS
  • Fiber Optic Sample Holder (FOSH)
  • RSO (Reciprocating Sample Option)
  • ACMS (Extraction magnetometer)
  • VSM (Vibrating Sample Magnetometer)
  • Oven VSM
  • TTO (Thermal Transport)
  • ACT (AC resistivity Transport measurements; He-3 compatible)
  • HC (Heat Capacity; He-3 compatible)
  • DC Resistivity (He-3 compatible)
  • He-3 (optional; allows temperature operation down to 0.35 K)
  • XacTransversal (Susceptibility transverse to H)
  • Pressure Cell PPMS (DC Resistivity measurements; He-3 non-compatible)